PAPERS
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Full citation: Bashir, Muhammad, and Linda Milor. “Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements.” IEEE Design & Test of Computers, November/December… Read more.
8–12 minutes -
Full citation: Milor, L., & Hong, C. (2010). “Area Scaling for Backend Dielectric Breakdown.” IEEE Transactions on Semiconductor Manufacturing, 23(3), 429–441. https://doi.org/10.1109/TSM.2010.2051730. Plain-Language Overview… Read more.
9–14 minutes -
Full citation: Muhammad Muqarrab Bashir and Linda Milor, “Determining the Impact of Within-Die Variation on Circuit Timing,” IEEE Transactions on Semiconductor Manufacturing,… Read more.
9–13 minutes
